Alignment testing for tiered semiconductor structure

ABSTRACT

Among other things, one or more techniques or systems for evaluating a tiered semiconductor structure, such as a stacked CMOS structure, for misalignment are provided. In an embodiment, a connectivity test is performed on vias between a first layer and a second layer to determine a via diameter and a via offset that are used to evaluate misalignment. In an embodiment, a connectivity test for vias within a first layer is performed to determine an alignment rotation based upon which vias are connected through a conductive arc within a second layer or which vias are connected to a conductive pattern out of a set of conductive patterns. In this way, the via diameter, the via offset, or the alignment rotation are used to evaluate the tiered semiconductor structure, such as during a stacked CMOS process, for misalignment.

RELATED APPLICATION

This application is a continuation of and claims priority to U.S. patentapplication Ser. No. 16/126,458, titled “ALIGNMENT TESTING FOR TIEREDSEMICONDUCTOR STRUCTURE” and filed on Sep. 10, 2018, which claimspriority to Ser. No. 15/601,226, titled “ALIGNMENT TESTING FOR TIEREDSEMICONDUCTOR STRUCTURE” and filed on May 22, 2017, which claimspriority to U.S. patent application Ser. No. 14/063,414, titled“ALIGNMENT TESTING FOR TIERED SEMICONDUCTOR STRUCTURE” and filed on Oct.25, 2013. U.S. patent application Ser. Nos. 16/126,458, 15/601,226, and14/063,414 are incorporated herein by reference.

BACKGROUND

A tiered semiconductor structure, such as a stacked CMOS structure,comprises a plurality of tiers within which semiconductor devices, suchas PMOS or NMOS devices, are formed. In an example, a first tiercomprises a first structure of a semiconductor device and a second tiercomprises a second structure of the semiconductor device. A via is usedto connect the first structure to the second structure. Becausetier-to-tier vias are relevantly small, such as a via having a diameterless than 0.3 μm, misalignment, incomplete tunneling, or over tunnelingcan occur during a stacking process, such as a CMOS stacking process,that results in stacking system yield loss or other penalties.

DESCRIPTION OF THE DRAWINGS

FIG. 1 is an illustration of a tiered semiconductor structure, accordingto some embodiments.

FIG. 2A is a flow diagram illustrating a method of evaluating a tieredsemiconductor structure, according to some embodiments.

FIG. 2B is an illustration of alignment measurements derived from anevaluation of a tiered semiconductor structure, according to someembodiments.

FIG. 3A is an illustration of a system for evaluating a tieredsemiconductor structure in a first alignment direction, according tosome embodiments.

FIG. 3B is an illustration of evaluating connectivity of one or morevias, according to some embodiments.

FIG. 4A is an illustration of evaluating a tiered semiconductorstructure in a first alignment direction, according to some embodiments.

FIG. 4B is an illustration of evaluating a tiered semiconductorstructure in a second alignment direction, according to someembodiments.

FIG. 4C is an illustration of alignment measurements derived from anevaluation of a tiered semiconductor structure in multiple directions,according to some embodiments.

FIG. 5A is an illustration of a system for evaluating a tieredsemiconductor structure utilizing a conductive arc, according to someembodiments.

FIG. 5B is an illustration of a perspective view of a conductive arc andone or more vias, according to some embodiments.

FIG. 5C is an illustration of evaluating a tiered semiconductorstructure utilizing a conductive arc, according to some embodiments.

FIG. 5D is an illustration of evaluating a tiered semiconductorstructure utilizing a conductive arc, according to some embodiments.

FIG. 5E is an illustration of evaluating a tiered semiconductorstructure utilizing a conductive arc, according to some embodiments.

FIG. 5F is an illustration of evaluating a tiered semiconductorstructure utilizing a conductive arc, according to some embodiments.

FIG. 6 is an illustration of a set of conductive patterns utilized by analignment tester component to evaluate a tiered semiconductor structurefor misalignment, according to some embodiments.

FIG. 7 is an illustration of a tier of a tiered semiconductor structurehaving one or more test structures formed therein, according to someembodiments.

FIG. 8 is an illustration of one or more transmission techniques fortransmitting testing signals to test structures, according to someembodiments.

FIG. 9 is an illustration of a stacked CMOS process and test workflow,according to some embodiments.

DETAILED DESCRIPTION

The claimed subject matter is now described with reference to thedrawings, wherein like reference numerals are generally used to refer tolike elements throughout. In the following description, for purposes ofexplanation, numerous specific details are set forth in order to providean understanding of the claimed subject matter. It is evident, however,that the claimed subject matter can be practiced without these specificdetails. In other instances, structures and devices are illustrated inblock diagram form in order to facilitate describing the claimed subjectmatter.

One or more techniques or systems for evaluating a tiered semiconductorstructure are provided. In an embodiment, the tiered semiconductorstructure is tested for alignment in one or more dimensions by measuringa via diameter and an offset distance between a first set of vias withina first layer of the tiered semiconductor structure and a second set ofvias within a second layer of the tiered semiconductor structure. In anembodiment, the tiered semiconductor structure is tested for alignmentrotation in one or more dimensions by determining which vias within afirst layer are connected by a conductive arc within in a second layerof the tiered semiconductor structure. In an embodiment, teststructures, used to test for alignment, are formed on a wafer edge, ascribe line, or within a device of the tiered semiconductor structure.In an embodiment, test signals are transmitted, such as from a sourceseparate from a test structure, utilizing a contact probe, a contactlesscoupling, or a probe coupling hybrid. In an embodiment, alignment istested during various stages of a CMOS stacking processing, such asduring or between a wafer fabrication stage, a wafer bonding stage, aknown good die (KGD) bonding stage or iterations therein, etc. In anembodiment, one or more optional units are invoked by alignment testingduring the CMOS stacking processing, such as a testing unit, a repairunit, or a fault tolerance unit. In this way, misalignment andquantization of such are efficiently detected for three-dimensionalintegrated circuit (3DIC) stacking processes so that misalignment issuesare detected early for reprocessing, repair, etc.

FIG. 1 illustrates a tiered semiconductor structure 100. The tieredsemiconductor structure 100 comprises one or more tiers, such as a firsttier 102, a second tier 104, a third tier 106, or other tiers notillustrated. In an embodiment, an integrated circuit is formed acrossone or more tiers, such that a tier comprises a portion of theintegrated circuit. Such portions are electrically connected by vias. Inan embodiment, a tunnel is formed through the second tier 104 to createa via 110, such as a bottom via portion, during processing of the secondtier 104. A tunnel is formed through the first tier 102 to create a via108, such as a top via portion, during processing of the first tier 102.Misalignment 112 can occur between the via 108 of the first tier 102 andthe via 110 of the second tier 104 due to the relatively small size ofvias or other misalignment factors introduced during a stacking processthat forms the tiered semiconductor structure 100. Accordingly, asprovided herein, alignment is tested during the stacking process so thatmisalignment is detected or repaired during the stacking process.

A method 200 of evaluating a tiered semiconductor structure, such as thetiered semiconductor structure 100, is illustrated in FIG. 2A. Thetiered semiconductor structure 100 is evaluated for alignment in orderto detect, quantize, or repair misalignment, such as during a stackingprocess of the tiered semiconductor structure 100 such as a CMOSstacking process. At 202, connectivity is evaluated between a first setof vias within the first layer 102 of the tiered semiconductor structure100 and a second set of vias within a second layer 104 of the tieredsemiconductor structure 100 to determine a via connection count. The viaconnectivity count corresponding to a number of via connections thatpass a connectivity test. In an embodiment, 12 vias, such as a via (1)252, a via (2) 254, a via (3) 256, a via (4) 258, a via (5) 260, a via(6) 262, a via (7) 264, a via (8) 266, a via (9) 268, a via (10) 270, avia (11) 272, and a via (12) 274 of FIG. 2B, are formed from 12 top viaportions within the first set of vias of the first layer 102 and from 12bottom vias portions within the second set of vias of the second layer104. Connectivity of a first via is tested by determining whether afirst top via portion within the first set of vias is electricallyconnected to, such as touching, a first bottom via portion within thesecond set of vias. If the first top via portion is electricallyconnected to the first bottom via portion, then a first via connectionof the first via passes the connectivity test and is included in the viaconnection count. However, if the first top via portion is notelectrically connected to the first bottom via portion, then the firstvia connection of the first via fails the connectivity test and is notincluded in the via count. In an embodiment, a via connection count of 7is determined based upon 7 via connections 278: via (5) 260, via (6)262, via (7) 264, via (8) 266, via (9) 268, via (10) 270, and via (11)272 passing the connectivity test and 5 via connections 276: via (1)252, via (2) 254, via (3) 256, via (4) 258, and via (12) 274 failing theconnectivity test, as illustrated by alignment measurements 250 of FIG.2B.

At 204, a first via diameter 280 for vias of the first set of vias isdetermined based upon the via connection count and a pitch differencebetween vias of the first set of vias and vias of the second set ofvias, as illustrated by alignment measurements 250 of FIG. 2B. In anexample, the pitch difference is 0.1 μm based upon a first via pitch of0.9 μm between vias in the first set of vias and a second via pitch of1.0 μm between vias in the second set of vias. In an embodiment, thefirst via diameter 280 corresponds to half the via connection countmultiplied by the pitch difference between vias of the first set of viasand vias of the second set of vias. For example, the first via diameteris determined to be 0.35 μm because half the via connection count of 7if 3.5 and the pitch difference is 0.1 μm. At 206, a first offset 282 isdetermined based upon an offset measurement between a target design viaand a measured center via, as illustrated by alignment measurements 250of FIG. 2B. The target design via is a via designated during design tobe a center via (e.g., a via intended to be a center via within a groupof vias that pass the connectivity test), such as a via (7) 264 where atop via (7) portion of the first set of vias is designed to directlyalign with a bottom via (7) portion of the second set of vias. Themeasured center via is a via that is actually centered within a group ofvias that pass the connectivity test. As such, the measured center viacorresponds to the via where a top via portion directly aligns with abottom via portion, such as a via (8) 266 where a top via (8) portionthat directly aligns with a bottom via (8) portion. The offsetmeasurement corresponds to the pitch difference and a via differencebetween the measured center via and the target design via. Thedifference between the measured center via and the target design via is1 because there is a 1 via difference between the target design via asvia (7) 264 and the measured center via as via (8) 266. Accordingly, anoffset distance of 0.1 μm is determined for the first offset 282 basedupon the 1 via difference and the 0.1 μm pitch difference. An offsetdirection of a positive x direction is determined based upon themeasured center via as via (8) 266 being located in a positive xdirection from the target design via as via (7) 264. In this way, thefirst offset 282 comprising the offset distance and the offset directionis determined. At 208, the tiered semiconductor structure 100 isevaluated for misalignment based upon the first via diameter and thefirst offset.

FIG. 3A illustrates a system 300 for evaluating a tiered semiconductorstructure 100 in a first alignment direction. The system 300 comprisesan alignment tester component 306 configured to determine a first viadiameter and a first offset associated with one or more vias, such as 12vias, formed by the first layer 102 and the second layer 104 of thetiered semiconductor structure 100. In an embodiment, the first layer102 comprises a first set of vias comprising top via portions for vias(0)-(10), and the second layer 104 comprises a second set of viascomprising bottom via portions for the vias (0)-(10). Top via portionswithin the first set of vias have a via pitch 302, such as 1.0 μm.Bottom via portions within the second set of vias have a via pitch 304,such as 0.9 μm. Via (3) 318 is designated as a target design via, suchas a via specified during design to be a center via where a top via (3)portion directly aligns with a bottom via (3) portion.

The alignment tester component 306 is configured to perform aconnectivity test to determine a via connection count corresponding to anumber of vias having electrical connectivity between top via portionsand bottom via portions. In an embodiment, the alignment testercomponent 306 transmits test signals 320 to test structures, such as thevias, within the tiered semiconductor structure 100 to obtain testingresults 322 for the connectivity test. In an embodiment of performingthe connectivity test, the alignment tester component 306 determinesthat a via (0) 308 fails the connectivity test, indicating that a topvia (0) portion 308 a is not electrically connected, such as touching, abottom via (0) portion 308 b, as illustrated in FIG. 3B. The alignmenttester component 306 determines that a via (1) 310 passes theconnectivity test, indicating that a top via (1) portion 310 a iselectrically connected, such as touching, a bottom via (1) portion 310b. The alignment tester component 306 determines that a via (4) 312passes the connectivity test, indicating that a top via (4) portion 312a is electrically connected, such as touching, a bottom via (4) portion312 b. The alignment tester component 306 determines that the via (4)312 is a measured center via based upon the top via (4) portion 312 abeing directly aligned with the bottom via (4) portion 312 b. In thisway, the alignment tester component 306 determines a via connectioncount of 7 based upon vias (1)-(7) passing the connectivity test, andvia (0) 308 and vias (8)-(10) failing the connectivity test. Thealignment tester component 306 is configured to determine a first viadiameter based upon the via connection count and a pitch differencebetween vias of the first set of vias and vias of the second set ofvias, such as a first via diameter of 0.35 μm corresponding to half thevia connection count of 7 multiplied by a 0.1 μm pitch difference (asexplained in the next paragraph) between vias of the first set of viasand vias of the second set of vias.

The alignment tester component 306 is configured to determine a firstoffset based upon an offset measurement between the target design via,such as the via (3) 318, and a measured center via, such as the via (4)312. The offset measurement corresponds to the pitch differencemultiplied by a via difference between the measured center via and thetarget design via. A pitch difference of 0.1 μm is determined based upona difference between the via pitch 302 of 1.0 μm for the first set ofvias and the via pitch 304 of 0.9 μm for the second set of vias. A viadifference of 1 is determined based upon a 1 via difference between thevia (3) 318 as the target design via and the via (4) 312 as the measuredcenter via. Accordingly, an offset difference of 0.1 μm is determinedfor the first offset based upon the 1 via difference and the 0.1 μmpitch difference of the offset measurement. An offset direction of apositive x direction is determined for the first offset based upon thevia (4) 312 as the measured center via being in positive x directionwith respect to the via (3) 318 as the target design via. In this way,the alignment tester component 306 determines a first offset of 0.1 μmin the positive x direction. The alignment tester component 306 isconfigured to evaluate the tiered semiconductor structure 100 formisalignment based upon the first via diameter and the first offset.

In an embodiment, the alignment tester component 306 is configured toevaluate the tiered semiconductor structure for misalignment in multipledirections, such as multiple dimensions, as illustrated in FIGS. 4A, 4B,and 4C. FIG. 4A illustrates performing a first connectivity test 400 ina first direction, such as an x-direction. First measurements 422 of thefirst connectivity test 400, such as a determination of a first viadiameter of 0.35 μm and a first offset of 0.2 μm in a negativex-direction, are illustrated in result set 420 of FIG. 4C. In anembodiment, the first measurements 422 are determined based upon 7 vias,such as vias (2)-(8), passing the first connectivity test 400 and 2vias, such as via (1) and via (9) failing the first connectivity test400, where the first via diameter corresponds to half a via connectioncount of 7 corresponding to the 7 vias that passed the firstconnectivity test 400 multiplied by a pitch difference of 0.1 μm. Thefirst offset of 0.2 μm in the negative x-direction corresponds to anoffset measurement that is based upon a via difference of 2 between atarget design via, such as a via (7) 404, and a measured center via,such as a via (5) 402, and based upon the pitch difference of 0.1 μmbetween a first pitch of vias within the first set of vias and a secondpitch of vias within the second set of vias. FIG. 4B illustratesperforming a second connectivity test 410 in a second direction, such asa y-direction. Second measurements 424 of the second connectivity test410, such as a determination of a second via diameter of 0.35 μm and asecond offset of 0.2 μm in a negative y-direction, are illustrated inthe result set 420 of FIG. 4C. In an embodiment, the second measurements424 are determined based upon 7 vias, such as vias (2)-(8), passing thesecond connectivity test 410 and 2 vias, such as via (1) and via (9)failing the second connectivity test 410, where the second via diametercorresponds to half a via connection count of 7 corresponding to the 7vias that passed the second connectivity test 410 multiplied by a pitchdifference of 0.1 μm. The second offset of 0.2 μm in the negativey-direction corresponds to an offset measurement that is based upon avia difference of 2 between a target design via, such as the via (7)404, and a measured center via, such as the via (5) 402, and based uponthe pitch difference of 0.1 μm between the first pitch of vias withinthe first set of vias and the second pitch of vias within the second setof vias. In this way, the tiered semiconductor structure 100 isevaluated in multiple dimensions for misalignment.

FIG. 5A illustrates a system 500 for evaluating the tiered semiconductorstructure 100 utilizing a conductive arc 510. The system 500 comprisesthe alignment tester component 306 configured to evaluate alignment ofthe tiered semiconductor structure 100 by performing connectivity tests,such as transmitting testing signals 320 to the tiered semiconductorstructure 100 to obtain testing results 322. The alignment testercomponent 306 is configured to evaluate connectivity, through theconductive arc 510 within the second layer 104 of the tieredsemiconductor structure 100, between one or more vias within the firstlayer 102 of the tiered semiconductor structure 100, such as a first via502, a second via 504, and a third via 506. It is appreciated that anynumber of vias can be evaluated for connectivity. The conductive arc 510comprises a notch having a notch angle 508. In an embodiment, theconductive arc 510 comprises a conductive material, such as a metalmaterial, and the notch is non-conductive, such as empty space or air.FIG. 5B illustrates a perspective view of the conductive arc 510 and theone or more vias.

In an embodiment, the alignment tester component 306 determines that thefirst via 502 has connectivity through the conductive arc 510 to thethird via 506, and that the first via 502 does not have connectivitywith the second via 504, as illustrated in FIG. 5C. Accordingly, thealignment tester component 306 determines an alignment rotation having arotational value less than the notch angle 508. In this way, the tieredsemiconductor structure 100 is evaluated for misalignment based upon thealignment rotation.

In an embodiment, the alignment tester component 306 determines that thefirst via 502 has connectivity through the conductive arc 510 to thesecond via 504, and that the first via 502 does not have connectivitywith the third via 506, as illustrated in FIG. 5D. Accordingly, thealignment tester component 306 determines an alignment rotation having acounterclockwise rotation value between half the notch angle 508 and thenotch angle 508. In this way, the tiered semiconductor structure 100 isevaluated for misalignment based upon the alignment rotation.

In an embodiment, the alignment tester component 306 determines that thethird via 506 has connectivity through the conductive arc 510 to thesecond via 504, and that the first via 502 does not have connectivitywith the third via 506, as illustrated in FIG. 5E. Accordingly, thealignment tester component 306 determines an alignment rotation having aclockwise rotation value between half the notch angle 508 and the notchangle 508. In this way, the tiered semiconductor structure 100 isevaluated for misalignment based upon the alignment rotation.

In an embodiment, the alignment tester component 306 determines that thefirst via 502, the second via 504, and the third via 506 haveconnectivity through the conductive arc 510, as illustrated in FIG. 5F.Accordingly, the alignment tester component 306 determines an alignmentrotation having a rotation value greater than the notch angle 508. Inthis way, the tiered semiconductor structure 100 is evaluated formisalignment based upon the alignment rotation.

FIG. 6 illustrates a set of conductive patterns 640 utilized by thealignment tester component 306 to evaluate the tiered semiconductorstructure 100 for misalignment. The set of conductive patterns 640comprises one or more conductive patterns, such as a first conductivepattern 600, a second conductive pattern 610, a third conductive pattern620, a fourth conductive pattern 630, or other conductive patterns notillustrated. The conductive patterns within the set of conductivepatterns 604 have notches formed at notch offset angles, such as thefirst conductive pattern 600 having a −10° notch offset angle, thesecond conductive pattern 610 having a −5° notch offset angle, the thirdconductive pattern 620 have a 0° notch offset angle, and the fourthconductive pattern 630 having a +5 notch offset angle. In an embodiment,the set of conductive patterns 640 are formed, such as within the secondlayer 104 of the tiered semiconductor structure 100, as a matrix of teststructures for alignment testing where the alignment tester component306 sends testing signals 320 to the tiered semiconductor structure 100to obtain testing results 322 for misalignment evaluation.

The alignment tester component 306 is configured to evaluateconnectivity of one or more vias, such as the first via 502, the secondvia 504, and the third via 506, based upon a connectivity test having apass criteria of the first via 502 being connected to the third via 506and the first via 502 not being connected to the second via 504 througha connectivity ring of a conductive pattern. In an embodiment, theconnectivity test is passed for the first conductive pattern 600, but isfailed by the second conductive pattern 610, the third conductivepattern 620, and the fourth conductive pattern 630. The connectivitytest is passed for the first conductive pattern 600 because the firstvia 502 is connected to the third via 506 and the first via 502 is notconnected to the second via 504 through a connectivity ring 602 of thefirst conductive pattern 600. Accordingly, the alignment testercomponent 306 determines an alignment rotation having a rotational valuecorresponding to the −10° notch offset angle of the first conductivepattern 600. In this way, the tiered semiconductor structure 100 isevaluated for misalignment based upon the alignment rotation.

FIG. 7 illustrates a tier 700 of the tiered semiconductor structure 100having one or more test structures formed therein. In an embodiment, atest structure comprises a structure, such as a conductive arc or a via,used to test for alignment between tiers of the tiered semiconductorstructure 100. In an embodiment, a test structure is formed as analignment mark for prober alignment. In an embodiment, a test structureis formed on a wafer edge 702 of the tier 700. In an embodiment, a teststructure is formed on a scribe line 706. In an embodiment, a teststructure is formed within a device 704. Testing signals 320 aretransmitted to test structures utilizing various transmissiontechniques, such as a contactless coil coupling 708, a probing pad 710,a probing via 802, or a probe coupling hybrid such as a hybrid coil/pad804, as illustrated in FIG. 8. In an embodiment, the testing signals 320are transmitted from a source, such as a tester, that is separated froma test structure. In an embodiment, a direct testing signal istransmitted from automatic test equipment (ATE), such as directlytransmitted to a test structure. In an embodiment, a testing trigger,created by a built in self testing engine (GIST) employed by the ATE, istransmitted to initiate testing of test structure.

FIG. 9 illustrates a stacked CMOS process and test workflow 900. At 902,one or more tiers of the tiered semiconductor structure 100 arefabricated. At 904, a first partial test wafer stage is performed. In anembodiment, the first partial test wafer stage transmits one or moretesting signals 320, such as direct testing signals or testing triggers,to one or more test structures, such as vias or conductive arcs, formedwithin the one or more tiers. The testing signals are used to performconnectivity tests to evaluate misalignment between the one or moretiers. In an embodiment, misalignment is identified from a via diameterand an offset detected between vias of two or more tiers. In anembodiment, misalignment is identified from alignment rotation detectedbetween vias of a tier and a conductive arc of another tier. In anembodiment, a repair unit of a testing tier is invoked to process theone or more tiers, such as to repair or correct misalignment, during thefirst partial test wafer stage 904.

At 906, a wafer bonding stage 906 is performed, such as to bond a waferwith a blank wafer. At 908, a first known good die (KGD) test 908 isperformed, such as to detect misalignment. In an embodiment, the repairunit of the testing tier is invoked to process the one or more tiers,such as to repair or correct misalignment, during the first KGD teststage 908. At 910, a KGD bonding stage 910 is performed to bond KGDwafers. At 912, a partial known good stack (KGS) test 912 is performedduring the KGD bonding stage 910, such as to evaluate a partial KGSwafer or two bonded KGD wafers for misalignment. In an embodiment, thepartial KGS test stage 912 transmits one or more testing signals 320,such as direct testing signals or testing triggers, to one or more teststructures, such as vias or conductive arcs, formed within the one ormore tiers. The testing signals 320 are used to perform connectivitytests to evaluate misalignment between the one or more tiers, such asmisalignment corresponding via diameters, offsets, or alignment rotationmeasurements. In an embodiment, a testing unit, the repair unit, or afault tolerance unit of the testing tier are invoked to process the oneor more tiers, such as to repair or correct misalignment, during thepartial KGS wafer test stage 912. At 914, a full KGS test stage 914 isperformed, such as after the KGD bonding stage 910. In an embodiment,the repair unit of the testing tier is invoked to process the one ormore tiers, such as to repair or correct misalignment, during the fullKGS test stage 914.

According to an aspect of the instant disclosure, a method forevaluating a tiered semiconductor structure is provided. The methodcomprises evaluating connectivity between a first set of vias within afirst layer of a tiered semiconductor structure and a second set of viaswithin a second layer of the tiered semiconductor structure to determinea via connection count. The via connection count corresponds to a numberof via connections that pass a connectivity test. A first via diameteris determined based upon the via connection count. A first offset isdetermined based upon an offset measurement between a target design viaand a measured center via. The first offset comprises an offset distanceand an offset direction.

According to an aspect of the instant disclosure, a system forevaluating a tiered semiconductor structure is provided. The systemcomprises an alignment tester component. The alignment tester componentis configured to evaluate connectivity between a first set of viaswithin a first layer of a tiered semiconductor structure and a secondset of vias within a second layer of the tiered semiconductor structureto determine a first via diameter and a first offset based upon a firstconnectivity test in a first alignment direction. The alignment testercomponent is configured to evaluate the tiered semiconductor structurefor misalignment based upon the first via diameter and the first offset.

According to an aspect of the instant disclosure, a system forevaluating a tiered semiconductor structure is provided. The systemcomprises an alignment tester component. The alignment tester componentis configured to evaluate connectivity, through a conductive arc withina second layer of a tiered semiconductor structure, between a first via,a second via, and a third via of a first layer of the tieredsemiconductor structure to determine an alignment rotation. Thealignment tester component is configured to evaluate the tieredsemiconductor structure for misalignment based upon the alignmentrotation.

Although the subject matter has been described in language specific tostructural features or methodological acts, it is to be understood thatthe subject matter of the appended claims is not necessarily limited tothe specific features or acts described above. Rather, the specificfeatures and acts described above are disclosed as embodiment forms ofimplementing at least some of the claims.

Various operations of embodiments are provided herein. The order inwhich some or all of the operations are described should not beconstrued to imply that these operations are necessarily orderdependent. Alternative ordering will be appreciated given the benefit ofthis description. Further, it will be understood that not all operationsare necessarily present in each embodiment provided herein. Also, itwill be understood that not all operations are necessary in someembodiments.

It will be appreciated that layers, features, elements, etc. depictedherein are illustrated with particular dimensions relative to oneanother, such as structural dimensions or orientations, for example, forpurposes of simplicity and ease of understanding and that actualdimensions of the same differ substantially from that illustratedherein, in some embodiments. Additionally, a variety of techniques existfor forming the layers features, elements, etc. mentioned herein, suchas etching techniques, implanting techniques, doping techniques, spin-ontechniques, sputtering techniques such as magnetron or ion beamsputtering, growth techniques, such as thermal growth or depositiontechniques such as chemical vapor deposition (CVD), physical vapordeposition (PVD), plasma enhanced chemical vapor deposition (PECVD), oratomic layer deposition (ALD), for example.

Further, unless specified otherwise, “first,” “second,” or the like arenot intended to imply a temporal aspect, a spatial aspect, an ordering,etc. Rather, such terms are merely used as identifiers, names, etc. forfeatures, elements, items, etc. For example, a first channel and asecond channel generally correspond to channel A and channel B or twodifferent or two identical channels or the same channel.

Moreover, “exemplary” is used herein to mean serving as an example,instance, illustration, etc., and not necessarily as advantageous. Asused in this application, “or” is intended to mean an inclusive “or”rather than an exclusive “or”. In addition, “a” and “an” as used in thisapplication are generally to be construed to mean “one or more” unlessspecified otherwise or clear from context to be directed to a singularform. Also, at least one of A and B or the like generally means A or Bor both A and B. Furthermore, to the extent that “includes”, “having”,“has”, “with”, or variants thereof are used, such terms are intended tobe inclusive in a manner similar to “comprising”.

Also, although the disclosure has been shown and described with respectto one or more implementations, equivalent alterations and modificationswill occur to others skilled in the art based upon a reading andunderstanding of this specification and the annexed drawings. Thedisclosure includes all such modifications and alterations and islimited only by the scope of the following claims. In particular regardto the various functions performed by the above described components(e.g., elements, resources, etc.), the terms used to describe suchcomponents are intended to correspond, unless otherwise indicated, toany component which performs the specified function of the describedcomponent (e.g., that is functionally equivalent), even though notstructurally equivalent to the disclosed structure. In addition, while aparticular feature of the disclosure may have been disclosed withrespect to only one of several implementations, such feature may becombined with one or more other features of the other implementations asmay be desired and advantageous for any given or particular application.

What is claimed is:
 1. A method, comprising: forming a first layer of asemiconductor structure comprising a conductive arc having a specifiedshape; forming a second layer of the semiconductor structure comprisinga first via, a second via, and a third via arranged according to thespecified shape; determining a rotational alignment between the firstlayer and the second layer, wherein determining the rotational alignmentcomprises: transmitting a first test signal through the first via;measuring a response at the second via to determine whether the firstvia is electrically coupled to the second via through the conductivearc; and measuring a response at the third via to determine whether thefirst via is electrically coupled to the third via through theconductive arc.
 2. The method of claim 1, wherein: the specified shapeis a circle, and the conductive arc is arranged at a circumference ofthe circle.
 3. The method of claim 2, wherein the first via, the secondvia, and the third via are arranged at the circumference of the circle.4. The method of claim 1, wherein: the first via, the second via, andthe third via are arranged along an arc segment, and a center axis ofthe arc segment and a center axis of the conductive arc are coaxial. 5.The method of claim 1, wherein: a notch is defined between a first edgeof the conductive arc and a second edge of the conductive arc, a notchangle of the notch is defined between the first edge of the conductivearc and the second edge of the conductive arc, and the first via isspaced apart from the third via by an angle substantially equal to thenotch angle.
 6. The method of claim 5, wherein: the second via isbetween the first via and the third via.
 7. The method of claim 1,wherein determining the rotational alignment comprises: transmitting asecond test signal through the second via; measuring a response at thefirst via to determine whether the second via is electrically coupled tothe first via through the conductive arc; and measuring a response atthe third via to determine whether the second via is electricallycoupled to the third via through the conductive arc.
 8. The method ofclaim 1, wherein the first via, the second via, and the third via areevenly spaced along an arc segment.
 9. The method of claim 1, wherein:the first via, the second via, and the third via are arranged along afirst arc segment, a notch is defined between a first edge of theconductive arc and a second edge of the conductive arc, the notchdefines a second arc segment, and a length of the first arc segment isgreater than a length of the second arc segment.
 10. The method of claim9, wherein: a length between the first via and the second via is lessthan the length of the second arc segment.
 11. A method for evaluating atiered semiconductor structure, comprising: evaluating connectivity,through a conductive arc within a first layer of a tiered semiconductorstructure, between a first via, a second via, and a third via of asecond layer of the tiered semiconductor structure to determine analignment rotation between the first layer and the second layer, whereinevaluating the connectivity comprises: transmitting a first test signalthrough the first via and measuring a response at the second via and thethird via to yield first results, and transmitting a second test signalthrough the second via and measuring a response at the first via and thethird via to yield second results; and evaluating the tieredsemiconductor structure for misalignment based upon the alignmentrotation.
 12. The method of claim 11, wherein evaluating theconnectivity comprises: determining a degree to which the conductive arcis rotated relative to a specified orientation of the conductive arc,the first via, the second via, and the third via to determine thealignment rotation.
 13. The method of claim 11, wherein the third via isdisposed between the first via and the second via.
 14. The method ofclaim 11, wherein evaluating the connectivity comprises: determining thealignment rotation using the first results and the second results. 15.The method of claim 11, wherein: the conductive arc comprises a firstarc segment having a first end and a second end, the first end isseparated from the second end by a second arc segment that isnon-conductive, the first via, the second via, and the third via areformed within the second layer and arranged along a third arc segmentspanning from the first via to the third via and having a length equalto a length of the second arc segment, the second via is disposedbetween the first via and the third via, and when the first layer isaligned with the second layer, the first via contacts the first end ofthe conductive arc and the third via contacts the second end of theconductive arc.
 16. A method, comprising: forming a first layer of asemiconductor structure comprising a conductive arc having a specifiedshape; forming a second layer of the semiconductor structure comprisinga first via, a second via, and a third via arranged according to thespecified shape; determining whether the first via is electricallycoupled to the second via through the conductive arc; and determiningwhether the first via is electrically coupled to the third via throughthe conductive arc.
 17. The method of claim 16, comprising: determiningwhether the second via is electrically coupled to the third via throughthe conductive arc.
 18. The method of claim 17, wherein: determiningwhether the first via is electrically coupled to the second via throughthe conductive arc and determining whether the first via is electricallycoupled to the third via through the conductive arc comprises:transmitting a first test signal through the first via; measuring aresponse to the first test signal at the second via; and measuring aresponse to the first test signal at the third via, and determiningwhether the second via is electrically coupled to the third via throughthe conductive arc comprises: transmitting a second test signal throughthe second via; and measuring a response to the second test signal atthe third via.
 19. The method of claim 16, wherein: the first via, thesecond via, and the third via are arranged along an arc segment, and acenter axis of the arc segment and a center axis of the conductive arcare coaxial.
 20. The method of claim 16, wherein: the first via, thesecond via, and the third via are arranged along a first arc segment, anotch is defined between a first edge of the conductive arc and a secondedge of the conductive arc, the notch defines a second arc segment, anda length of the first arc segment is greater than a length of the secondarc segment.